Use the vitals package with ellmer to evaluate and compare the accuracy of LLMs, including writing evals to test local models.

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Abstract: Defect recognition in semiconductor wafers is crucial in manufacturing process to identify the root cause. This paper presents an efficient wafer defects pattern recognition methodology ...

Abstract: Interior control signals derived from motor controllers have gained increasing attention in closed-loop motor drive systems for interturn short-circuit fault diagnosis. Mainstream diagnosis ...