Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...

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Support grids are a key part of electron microscopy measurements; the choice of the grid can directly influence the quality and accuracy of the final image. This is particularly true for transmission ...

This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, ...

Electron microscopes are used to visualize the structure of solids, molecules, or nanoparticles with atomic resolution. However, most materials are not static. Rather, they interact, move, and reshape ...

Traditional electron microscopy techniques include scanning electron microscopy (SEM) and transmission electron microscopy (TEM), where electrons that interact with the sample are imaged. 4 The ...

This year, the electron microscopy community marks the 25 th anniversary of the release of the first aberration-corrected transmission electron microscope. To celebrate the occasion, this article ...

A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...