This synthesis focused on DOT sampling and testing programs in use for technician qualification/certification in order to meet 23 CFR 637B requirements. Technician ...
Coherent interleaved sampling is a new technique that can acquire data faster with more data points than sequential sampling. Engineers who need to characterize semiconductor devices, high-speed ...
The literature review presented in this chapter describes the DOT certification programs and how they were developed in different ways, in part due to the flexibility found in 23 CFR 637B. Included is ...
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