Writing correct concurrent programs is harder than writing sequential ones. This is because the set of potential risks and failure modes is larger - anything that can go wrong in a sequential program ...

Since the first transistors went into production almost six decades ago, semiconductor manufacturers have looked for ways to reduce test time and manufacturing costs. As the industry has grown from ...

Semiconductor manufacturers continue to look for ways to reduce the cost of test for producing mixed-signal SOC and SIP devices. Parallel test strategies, known as multisite test, implemented on ATE ...

International Test Conference- Santa Clara, CA – Business Wire – October 25th, 2007 — Intellitech Corporation, www.intellitech.com, the leader in lowering electronic product costs through IEEE ...

Teradyne at Productronica highlighted its new TestStation Duo concurrent in-circuit tester, which combines two complete and independent test modules inside a single tester frame to enable ...