Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on ICs continues to double every 18 to 24 ...

Through A Series Of Enhancements, This Tool Suite Raises The Performance Of Test-Pattern Generation And At-Speed Testing. To design complex ASICs in a timely and cost-effective manner, engineers must ...

Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...

Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Automatic test pattern generation automatic test pattern generator is an electronic design automation method used to find an input sequence that, when applied to a digital circuit, enables automatic ...